Frontiers in Ultra-Precision Machining (Record no. 14920)

MARC details
000 -LEADER
fixed length control field 02251nam a2200133Ia 4500
008 - FIXED-LENGTH DATA ELEMENTS--GENERAL INFORMATION
fixed length control field 220615s9999||||xx |||||||||||||| ||und||
020 ## - INTERNATIONAL STANDARD BOOK NUMBER
International Standard Book Number 9783040000000
245 #0 - TITLE STATEMENT
Title Frontiers in Ultra-Precision Machining
546 ## - LANGUAGE NOTE
Language note English[eng]
650 ## - SUBJECT ADDED ENTRY--TOPICAL TERM
Topical term or geographic name entry element fused silica||small-scale damage||magnetorheological removing method||combined repairing process||evolution law||diamond grinding||single crystal silicon||subsurface damage||crystal orientation||spherical shell||thin-walled part||wall-thickness||benchmark coincidence||data processing||ultra-precision machining||computer-controlled optical surfacing||dwell time algorithm||removal function||elementary approximation||atmospheric pressure plasma jet||continuous phase plate||surface topography||high accuracy and efficiency||polar microstructures||optimization||machining parameters||cutting strategy||flexible grinding||shear thickening fluid||cluster effect||high-shear low-pressure||aluminum||ion beam sputtering||morphology evolution||molecular dynamics||electrochemical discharge machining (ECDM)||material removal rate (MRR)||electrode wear ratio (EWR)||overcut (OC)||electrical properties||tool material||diamond tool||single-point diamond turning||lubricant||ferrous metal||electrorheological polishing||polishing tool||roughness||integrated electrode||Nano-ZrO2 ceramics||ultra-precision grinding||surface residual material||surface quality||three-dimensional surface roughness||reversal method||eccentricity||piezoelectric actuator||flange||dynamic modeling||surface characterization||cutting forces||tool servo diamond cutting||data-dependent systems||surface topography variation||microstructured surfaces||microlens array||three-dimensional elliptical vibration cutting||piezoelectric hysteresis||Bouc–Wen model||flower pollination algorithm||dynamic switching probability strategy||parameter identification||atom probe tomography (APT)||single-wedge||lift-out||focused ion beam (FIB)||Al/Ni multilayers||vibration-assisted electrochemical machining (ECM)||blisk||narrow channel||high aspect ratio||multi-physics coupling simulation||machining stability||n/a
700 ## - ADDED ENTRY--PERSONAL NAME
Personal name Guo, Jiang||Wang, Chunjin||Kang, Chengwei
856 ## - ELECTRONIC LOCATION AND ACCESS
Uniform Resource Identifier <a href="https://mdpi.com/books/pdfview/book/5325">https://mdpi.com/books/pdfview/book/5325</a>
942 ## - ADDED ENTRY ELEMENTS (KOHA)
Koha item type E-Books
Holdings
Withdrawn status Lost status Damaged status Not for loan Home library Current library Date acquired Total Checkouts Date last seen Price effective from Koha item type
        Kerala University of Digital Sciences, Innovation and Technology Knowledge Centre Kerala University of Digital Sciences, Innovation and Technology Knowledge Centre 15/06/2022   15/06/2022 15/06/2022 E-Books