MOS interface physics, process and characterization / Shengkai Wang and Xiaolei Wang.
Material type:
TextPublication details: Boca Raton, CRC Press, 2022.Edition: 1st edDescription: xi, 161 : illustrations ; 24 cmISBN: - 9781032106274
- 9781032106281
- 621.381 WAN/M
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Kerala University of Digital Sciences, Innovation and Technology Knowledge Centre Applied Electronics | 621.381 WAN/M (Browse shelf(Opens below)) | Available | 6793 |
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| 621.381 SEN/M;2 Microsystem design | 621.381 SRI/C Carbon-based electronics: Transistors and interconnects at the nanoscale | 621.381 TEH/S Security opportunities in nano devices and emerging technologies | 621.381 WAN/M MOS interface physics, process and characterization / | 621.381 ZHA/A Advanced mechatronics and MEMS devices II | 621.381 ZHU/A Atomistic simulation of quantum transport in nanoelectronic devices / | 621.381046 JIN/I Introduction to microsystem packaging technology |
Includes bibliographical references.
"The electronic device based on Metal Oxide Semiconductor (MOS) structure is the most important component of a large-scale integrated circuit and the key to achieving high performance devices and integrated circuits is high quality MOS structure. This book contains abundant experimental examples focusing on MOS structure. The volume will be an essential reference for academics and postgraduates within the field of microelectronics"--
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