Flash Memory Devices 

<br/><br/><br/>English[eng] 
<br/><br/><label>ISBN: </label>9783040000000 
<br/><br/><label>Subjects--Topical Terms: </label><br/>retention characteristic||high-κ||nonvolatile charge-trapping memory||stack engineering||NOR flash memory||aluminum oxide||NAND flash memory||interference||Technology Computer Aided Design (TCAD) simulation||disturbance||program||non-volatile memory (NVM)||3D NAND Flash memories||random telegraph noise||Flash memory reliability||test platform||endurance||support vector machine||raw bit error||3D NAND Flash||RBER||reliability||flash signal processing||randomization scheme||solid-state drives||3D flash memory||performance cliff||tail latency||garbage collection||artificial neural network||error correction code||work function||effective work function||dipole||metal gate||high-k||SiO2||interfacial reaction||MHONOS||erase performance||3D NAND flash memory||temperature||read disturb||n/a