TY  - BOOK
AU  - Crouch, Alfred L
TI  - Design for test: For digital IC'S and embedded core systems
SN  - 9788131717899
U1  - 005.18 CRO/D 
PY  - 1999///
CY  - New Delhi
PB  - Pearson Education
KW  - EMBEDDED SYSTEMS
KW  - INTEGRATED CIRCUITS
ER  -