Wang, Shengkai,  1984- <br/><br/>
MOS interface physics, process and characterization / 
Shengkai Wang and Xiaolei Wang. 
 - 1st ed. 
 - Boca Raton,  CRC Press,  2022. 
 - xi, 161 :  illustrations ;  24 cm 
<br/><br/>Includes bibliographical references. 
<br/><br/> "The electronic device based on Metal Oxide Semiconductor (MOS) structure is the most important component of a large-scale integrated circuit and the key to achieving high performance devices and integrated circuits is high quality MOS structure. This book contains abundant experimental examples focusing on MOS structure. The volume will be an essential reference for academics and postgraduates within the field of microelectronics"-- 
<br/><br/><label>ISBN: </label>9781032106274 9781032106281 
<br/><br/><label>Subjects--Topical Terms: </label><br/>Metal oxide semiconductors--Design and construction--Mathematics.<br/>Semiconductors--Junctions.<br/>Integrated circuits--Research.<br/>Solid state physics--Experiments.
<br/><br/><label>Dewey Class. No.: </label>621.381 WAN/M