TY  - BOOK
AU  - Halak, Basel (Ed.)
TI  - Ageing of integrated circuits: Causes, effects and mitigation techiques
SN  - 9783030237806
U1  - 621.3815 HAL/A 
PY  - 2020///
CY  - Switzerland
PB  - Springer
KW  - ELECTRONICS/ ELECTRICAL ENGINEERING
KW  - INTEGRATED CIRCUITS
KW  - AGEING
ER  -