TY  - BOOK
AU  - Sa,J.P.Marques de
TI  - Pattern recognition: Concepts, methods, and applications 
SN  - 3540422978 (alk. paper)
U1  - 006.4 SA/P 
PY  - 2001///
CY  - Berlin, New York
PB  - Springer
KW  - Pattern perception
N1  - Includes bibliographical references and index
UR  - http://www.loc.gov/catdir/enhancements/fy0817/2001049077-d.html
UR  - http://www.loc.gov/catdir/enhancements/fy0817/2001049077-t.html
ER  -