Amazon cover image
Image from Amazon.com

Thermal-aware testing of digital VLSI circuits and systems

By: Material type: TextTextPublication details: New York, CRC Press, 2018.Description: xix,117pISBN:
  • 9780815378822
Subject(s): DDC classification:
  • 621.395 CHA/T
Tags from this library: No tags from this library for this title. Log in to add tags.
Star ratings
    Average rating: 0.0 (0 votes)
Holdings
Item type Current library Collection Call number Status Date due Barcode
Books Books Kerala University of Digital Sciences, Innovation and Technology Knowledge Centre Applied Electronics VLSI Design 621.395 CHA/T (Browse shelf(Opens below)) Available 5733

There are no comments on this title.

to post a comment.