000 00414nam a2200145Ia 4500
008 130318s9999 xx 000 0 und d
020 _a9788131717899
082 _a005.18 CRO/D
100 _aCrouch, Alfred L
245 _aDesign for test: For digital IC'S and embedded core systems
260 _bPearson Education
_aNew Delhi
_c1999
300 _a348
650 _aEMBEDDED SYSTEMS
650 _aINTEGRATED CIRCUITS
999 _c1717
_d1717