000			01388nam a2200133Ia 4500
008			220620s9999||||xx |||||||||||||| ||und||
020			_a9783040000000
245		0	_aOptical Thin Films and Structures _bDesign and Advanced Applications
546			_aEnglish[eng]
650			_afaraday rotation||thin films||magneto-optics||organic material||tolane derivatives||optical coatings||monitoring||deposition||titanium dioxide||optical constants||two-photon absorption||nonlinear refraction||scattering||laser-induced deflection||absorption measurement||CrWN coatings||microstructure evolution||spinodal decomposition||thermal stability||hardness||plasma enhanced magnetron sputtering||sidewall roughness||optical scattering loss||silicon-on-insulator waveguide||multilayer||ZnO||Ag||TCO||transmittance||structure||resistance||SnO2||Ti-doped||annealing temperature||electrical resistivity||optical sensors||optical materials||zeolites||ellipsometry||single wavelength ellipsometry||spectroscopic ellipsometry||poly(vinyl alcohol) copolymers||humidity sensing||Al-doped ZnO||ALD technique||transparent conductive layers||LC display||flexible PDLC devices||transparent conductive coatings||optical sensing||broadband design||linear and non-linear optical properties||organic diamagnetic materials
700			_aBabeva, Tsvetanka
856			_uhttps://mdpi.com/books/pdfview/book/3901
942			_cEB
999			_c26110 _d26110